ISP iEDX-150μT 도금 두께 측정


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ISP iEDX-150uT
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ISP iEDX-150μT 도금 두께 측정

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ISP iEDX-150μT

ISP iEDX-150uT
ISP iEDX-150uT

정보 :

X-ray tube Mo/Rh/W/Ag Target(Option), 50kVp, 1mA
Detection System FSDD(Fast Silicon Draft Detector)
Energy Resolution Si type Detector(FSDD) 122eV FWHM at Mn Kα
Collimator Poly capillary optics(Focal Spot 15um/30um) FWHM
Detection Element Ti(22)~U(92)
Sample Type Solid / Liquid / Powder, Multi-Layer
Size of the sample chamber 660mmX450mmX150mm / 500mmX450mmX150mm
Sample stage moving
possible distance
300mmX200mmX150mm / 220mmX200mmX150mm
Size of the sample table 310mm X 260mm
Key Features

Auto / Manual Stage Mode

Plating thickness measurement : General, Rh, Pd, Au, Ag, Sn, Ni

Film thickness measurement of multilayer thin films (up to 5 Layer)

Camera Magnification 40~80 x
Safety 3 point interlock
Type of Report

Excel, PDF / output

Custom form

Key Benefits

Micro focused measuring point(<70um) using capillary optics Film thickness measurement of multilayer thin films (up to 5 Layer) Convenient stage control Multi-point measurement possible Remote Support by on line

Application

Plating thickness measurement special, ENEPIG, Pd-Ni, Rh etc.

Plating analysis automobile parts, Electronic circuit board(PCB), Such as a capacitor

Analysis of single-layer, Multi-layer, Alloy plating

Thickness with Composition Ratio can be measure on time in alloy plating

더 알고 싶다면 저희에게 연락하십시오:

CÔNG TY TNHH CÔNG NGHỆ VIAM VINA

Địa chỉ trụ sở :Tầng1,Số 10 Đường Hoàng Ngân, Phường Ninh Xá, Tp.Bắc Ninh, tỉnh Bắc Ninh

Hotline:  0969 095 867 hoặc 0979880176

Email : sales@viamvina.com.vn

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