4-Lane TDR | TDT | E-DSO 4-Lane 56GBd PPG | ED 400G BERT ML4035

ML4035

Introduction

MultiLane’s ML4035-TDR joined our large and diverse collection of successful products as a 3-in-1 400G
BERT, 35 GHz electrical scope, and TDR instrument, allowing 400G BER tests, NRZ & PAM4 eye diagram
measurements, as well as medium impedance characterization and S-parameter evaluation.

Key Features

• High Resolution TDR/TDT measurements
• Low cost quadruple 35 GHz Time Domain
• 4×35 GHz analog bandwidth
  Reflectometry / Transmission optimized for
  high speed tests and measurements
• Impedance Profile Measurement
• Determination of the magnitude and polarity
  of any back reflected signal
• 4 ports per module expandable up to 32+
• Low power dissipation
• Sample aperture jitter below 60 fs

S-parameters

• Return loss
• Insertion loss
• Crosstalk
• Accurate multiport S-parameters

DSO features

• Low cost quadruple 35 GHz Digital Sampling
  Scope optimized for high speed data analysis
• High Fidelity Signal Capture
• Low intrinsic Jitter
• Control of multiple modules enabled through
  Fast Ethernet.
• User friendly GUI, high throughput APIs and
  libraries. The software supports both Linux
  and Windows.
• Supports external API calls from other
  software e.g. LabView.
• Repeatable performance and traceable to
  standards
• Single ended and differential electrical inputs
  for each of the four channels
• Color graded persistence in eye and pattern
  capture modes

Pulse Pattern Generator

• Data Rates 23 – 29 GBd and 46 – 58 GBd
• Ability to tune the bit rate in steps of 100 kbps
  and find the RX PLL locking margin.
• High frequency clock out > 2.4 GHz
• Independent control of inner eye levels
• Up to 0.8 Vppd output swing
• Supports Gray coding and polarity inversion
• PRBS 7/9/11/13/15/16/23/31/58 and their
  inverses
• PRBS13Q, PRBS31Q

4-Channel Digital Sampling Oscilloscope providing SerDes testing & characterization

Software Filters

The ML4035 software enables de-embedding the effects of cables connected between scope and DUT by means of s2p / s4p files. It also provides SW filters such as FFE that can be applied easily for signal post-processing.

DSO Applications

• High-Speed SerDes Testing & Characterization
• Design/Verification of Telecom and Datacom
  Components and Systems
• Electro-optical Transceiver Testing
• Multi-port system testing or Line Cards
• In-Situ testing of high port count systems
• Telecom Equipment Test for Installation and
  Maintenance.
• Fiber Channel, Ethernet, PON, Parallel Optics
• High port count burn-in test.

DSO Measurements

• Total Jitter decomposition (DJ, RJ)
• Mask Margin
• The mask margin can be extracted for a defined
  number of points that fail, thus allowing for
  DUT quality assessment, control and binning
• Number of failing points for a region can be
  returned as well as the actual points that failed.
• Eye opening, eye height and width, eye
  amplitude, top, base, max, min, peak to peak
• Rise/ fall time, single edge measurement in
  pattern capture
• Statistics histograms and histogram
  measurements
• Crossing percentage
• Pre-emphasis positive & negative
• Advanced Pattern Measurements
• Zooming, markers, X and Y histograms,
  overlays, & multiple measurements, statistics

If you want to know more, please contact us :

CÔNG TY TNHH CÔNG NGHỆ VIAM VINA

Địa chỉ trụ sở :Tầng1,Số 10 Đường Hoàng Ngân, Phường Ninh Xá, Tp.Bắc Ninh, tỉnh Bắc Ninh

Hotline:  0969 095 867 hoặc 0979880176

Email : sales@viamvina.com.vn